Lesson 1 - Digital Logic Fundamentals
Digital logic; Boolean algebra; Logical AND, OR, NOT function; Positive and negative logic; NAND logic; Combining logic circuits; TTL logic; IC logic devices
Learning Objectives:– Explain the difference between digital and analog circuits.
– Describe AND, NOT, and OR logic functions.
– Explain how solid-state switches can perform logic functions.
– Compare equivalent NAND and NOR gates using positive and negative logic.
– Discuss the importance of TTL and CMOS circuits.
Lesson 2 - Logic Building Blocks
Sequential logic; Flip-flops; Clock circuits; Schmitt triggers; Frequency dividers; Pulse counters
Learning Objectives:– Describe the function of a logic clock.
– Explain the operation of a flip-flop.
– Discuss the differences among clocked R-S flip-flops, D-latches, and J-K master-slave flip-flops.
– Explain how to convert between the decimal and binary number systems.
– Discuss the use of BCD and the octal and hexadecimal number systems.
Lesson 3 - Medium- and Large-Scale ICs
Counters; Serial vs. parallel data transmission; Registers; Multiplexers; Decoder/demultiplexers; Arithmetic circuits; LSI memories
Learning Objectives:– Explain the operation of each of the following counters: ripple, BCD, synchronous, and up/down.
– Describe the operation of a shift register.
– Discuss the difference between multiplexers and decoders/demultiplexers.
– Define the terms read, write, serial access, and random access as they apply to memories.
– Discuss the purposes of RAM and ROM devices.
Lesson 4 - Functional Logic Systems
Logic subsystems; Microprocessors; I/O subsystems; Noncontact switches; Multiple-bit I/O devices; Data codes, displays, and transfer
Learning Objectives:– Describe the sections of a basic logic system.
– Compare a ROM, a PROM, and a PLA.
– Name the basic parts of a microprocessor.
– Describe common kinds of I/O interfaces and data displays.
Lesson 5 - Troubleshooting Logic Systems
Gathering information; Isolating the problem; Localizing the trouble; Interpreting logic diagrams; Timing waveforms; Test equipment
Learning Objectives:– Describe seven external faults that can affect solid-state circuits.
– List the major steps in efficient troubleshooting.
– Name information sources for identifying system malfunctions.
– Explain how to trace a faulty component by using a troubleshooting tree.
– Explain how to use various kinds of test equipment to pinpoint system faults.